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Measurement noise evaluation, noise bandwidth specification and temperature effects in 3D point autofocusing microscopy (2018)

First Author: Maculotti G.

Attributed to: Metrology for precision and additive manufacturing funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Publication URI: https://api.elsevier.com/content/abstract/scopus_id/85054513196

Type: Other

Parent Publication: European Society for Precision Engineering and Nanotechnology, Conference Proceedings - 18th International Conference and Exhibition, EUSPEN 2018