Advances in electron channelling contrast imaging and electron backscatter diffraction for imaging and analysis of structural defects in the scanning electron microscope (2020)
Attributed to:
Manufacturing of nano-engineered III-nitride semiconductors
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1088/1757-899x/891/1/012023
Publication URI: https://api.elsevier.com/content/abstract/scopus_id/85093863358
Type: Journal Article/Review
Parent Publication: IOP Conference Series: Materials Science and Engineering
Issue: 1