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Advances in electron channelling contrast imaging and electron backscatter diffraction for imaging and analysis of structural defects in the scanning electron microscope (2020)

First Author: Trager-Cowan C

Attributed to: Manufacturing of nano-engineered III-nitride semiconductors funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/1757-899x/891/1/012023

Publication URI: https://api.elsevier.com/content/abstract/scopus_id/85093863358

Type: Journal Article/Review

Parent Publication: IOP Conference Series: Materials Science and Engineering

Issue: 1