Analyzing and Patching SPEKE in ISO/IEC (2018)

First Author: Hao F

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/tifs.2018.2832984

Publication URI: https://api.elsevier.com/content/abstract/scopus_id/85046486146

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Information Forensics and Security

Issue: 11