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Unipolar and Bipolar Pulsed Gate Stresses and Threshold Voltage Shifts in GaN e-HEMTs (2022)

First Author: Deb A

Attributed to: Reliability, Condition Monitoring and Health Management Technologies for WBG Power Modules funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/ecce50734.2022.9947415

Publication URI: https://api.elsevier.com/content/abstract/scopus_id/85144088340

Type: Conference/Paper/Proceeding/Abstract