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On the Repeatability and Reliability of Threshold Voltage Measurements during Gate Bias Stresses in Wide Bandgap Power Devices (2022)

First Author: Deb A

Attributed to: Reliability, Condition Monitoring and Health Management Technologies for WBG Power Modules funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/wipdaeurope55971.2022.9936437

Publication URI: https://api.elsevier.com/content/abstract/scopus_id/85142496424

Type: Conference/Paper/Proceeding/Abstract