On the Repeatability and Reliability of Threshold Voltage Measurements during Gate Bias Stresses in Wide Bandgap Power Devices (2022)
Attributed to:
Reliability, Condition Monitoring and Health Management Technologies for WBG Power Modules
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/wipdaeurope55971.2022.9936437
Publication URI: https://api.elsevier.com/content/abstract/scopus_id/85142496424
Type: Conference/Paper/Proceeding/Abstract