Impact of threshold voltage shifting on junction temperature sensing in GaN HEMTs (2022)
Attributed to:
Reliability, Condition Monitoring and Health Management Technologies for WBG Power Modules
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Publication URI: https://api.elsevier.com/content/abstract/scopus_id/85141552594
Type: Other
Parent Publication: 24th European Conference on Power Electronics and Applications, EPE 2022 ECCE Europe