📣 Help Shape the Future of UKRI's Gateway to Research (GtR)

We're improving UKRI's Gateway to Research and are seeking your input! If you would be interested in being interviewed about the improvements we're making and to have your say about how we can make GtR more user-friendly, impactful, and effective for the Research and Innovation community, please email gateway@ukri.org.

Simulations and Measurements of Failure Modes in SiC Cascode JFETs under Short Circuit Conditions (2021)

First Author: Agbo S

Attributed to: Reliability, Condition Monitoring and Health Management Technologies for WBG Power Modules funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/compel52922.2021.9646031

Publication URI: https://api.elsevier.com/content/abstract/scopus_id/85124225533

Type: Conference/Paper/Proceeding/Abstract