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Comparison of Short Circuit Failure Modes in SiC Planar MOSFETs, SiC Trench MOSFETs and SiC Cascode JFETs (2021)

First Author: Bashar E

Attributed to: Reliability, Condition Monitoring and Health Management Technologies for WBG Power Modules funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/wipda49284.2021.9645092

Publication URI: https://api.elsevier.com/content/abstract/scopus_id/85124013465

Type: Conference/Paper/Proceeding/Abstract