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Performance of SiC cascode JFETs under single and repetitive avalanche pulses (2020)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.microrel.2020.113644

Publication URI: https://api.elsevier.com/content/abstract/scopus_id/85085255708

Type: Journal Article/Review

Parent Publication: Microelectronics Reliability