Investigations of Short Circuit Robustness of SiC IGBTs with Considerations on Physics Properties and Design (2022)

First Author: Zhang L

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.4028/p-13z22g

Publication URI: https://api.elsevier.com/content/abstract/scopus_id/85134215053

Type: Journal Article/Review

Parent Publication: Materials Science Forum