Band alignments of sputtered dielectrics on GaN (2020)
Attributed to:
Capacitance spectroscopy led process innovations to improve VOC in CdTe thin film solar cells
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1088/1361-6463/ab5995
Publication URI: https://api.elsevier.com/content/abstract/scopus_id/85079549811
Type: Journal Article/Review
Parent Publication: Journal of Physics D: Applied Physics
Issue: 7