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A novel deep learning approach for event detection in smart manufacturing (2019)

First Author: Giannetti C.

Attributed to: Transfer Learning for Robust, Resilient and Transferable Cyber Manufacturing Systems funded by ISCF

Abstract

No abstract provided

Bibliographic Information

Publication URI: https://api.elsevier.com/content/abstract/scopus_id/85079503114

Type: Other

Volume: 2019-October

Parent Publication: Proceedings of International Conference on Computers and Industrial Engineering, CIE

ISSN: 21648689