Information-Rich Manufacturing Metrology
Attributed to:
Revisiting optical scattering with machine learning (SPARKLE)
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1007/978-3-030-05931-6_14
Publication URI: http://dx.doi.org/10.1007/978-3-030-05931-6_14
Type: Book Chapter
Book Title: Precision Assembly in the Digital Age - 8th IFIP WG 5.5 International Precision Assembly Seminar, IPAS 2018, Chamonix, France, January 14-16, 2018, Revised Selected Papers (2019)
Page Reference: 145-157