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Towards Superresolution Surface Metrology: Quantum Estimation of Angular and Axial Separations. (2019)

First Author: Napoli C

Attributed to: Metrology for precision and additive manufacturing funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1103/physrevlett.122.140505

PubMed Identifier: 31050483

Publication URI: http://europepmc.org/abstract/MED/31050483

Type: Journal Article/Review

Volume: 122

Parent Publication: Physical review letters

Issue: 14

ISSN: 0031-9007