Simulation Study of Vertically Stacked Lateral Si Nanowires Transistors for 5-nm CMOS Applications (2017)
Abstract
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Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/jeds.2017.2752465
Publication URI: http://dx.doi.org/10.1109/jeds.2017.2752465
Type: Journal Article/Review
Parent Publication: IEEE Journal of the Electron Devices Society
Issue: 6