Effect of Threading Dislocations on the Quality Factor of InGaN/GaN Microdisk Cavities. (2015)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1021/ph500426g

PubMed Identifier: 25839048

Publication URI: http://europepmc.org/abstract/MED/25839048

Type: Journal Article/Review

Volume: 2

Parent Publication: ACS photonics

Issue: 1

ISSN: 2330-4022