Direct Observation of Contact Reaction Induced Ion Migration and its Effect on Non-Ideal Charge Transport in Lead Triiodide Perovskite Field-Effect Transistors (2023)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1002/smll.202302494

PubMed Identifier: 37300316

Publication URI: http://europepmc.org/abstract/MED/37300316

Type: Journal Article/Review

Parent Publication: Small

Issue: 41

ISSN: 1613-6810