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Disentangling the Impact of Point Defect Density and Carrier Localization-Enhanced Auger Recombination on Efficiency Droop in (In,Ga)N/GaN Quantum Wells. (2023)

First Author: Barrett RM

Attributed to: Big-data for nano-electronics funded by UKRI FLF

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1021/acsphotonics.3c00355

PubMed Identifier: 37602288

Publication URI: http://europepmc.org/abstract/MED/37602288

Type: Journal Article/Review

Volume: 10

Parent Publication: ACS photonics

Issue: 8

ISSN: 2330-4022