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A Spectroscopic Reflectance-Based Low-Cost Thickness Measurement System for Thin Films: Development and Testing. (2023)

First Author: Sánchez-Arriaga NE

Attributed to: EPSRC NetworkPlus In Digitalised Surface Manufacturing: Towards "World's Best" Processes funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.3390/s23115326

PubMed Identifier: 37300053

Publication URI: http://europepmc.org/abstract/MED/37300053

Type: Journal Article/Review

Volume: 23

Parent Publication: Sensors (Basel, Switzerland)

Issue: 11

ISSN: 1424-8220