A Spectroscopic Reflectance-Based Low-Cost Thickness Measurement System for Thin Films: Development and Testing. (2023)
Abstract
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Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.3390/s23115326
PubMed Identifier: 37300053
Publication URI: http://europepmc.org/abstract/MED/37300053
Type: Journal Article/Review
Volume: 23
Parent Publication: Sensors (Basel, Switzerland)
Issue: 11
ISSN: 1424-8220