A Spectroscopic Reflectance-Based Low-Cost Thickness Measurement System for Thin Films: Development and Testing (2023)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.3390/s23115326

PubMed Identifier: 37300053

Publication URI: http://europepmc.org/abstract/MED/37300053

Type: Journal Article/Review

Parent Publication: Sensors

Issue: 11

ISSN: 1424-8220