Non-Destructive X-Ray Imaging of Patterned Delta-Layer Devices in Silicon (2023)

First Author: D'Anna N
Attributed to:  Measurement-based entanglement of single-dopant As spin qubits funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1002/aelm.202201212

Publication URI: http://dx.doi.org/10.1002/aelm.202201212

Type: Journal Article/Review

Parent Publication: Advanced Electronic Materials

Issue: 5