Dislocation-Induced Structural and Luminescence Degradation in InAs Quantum Dot Emitters on Silicon (2023)
Attributed to:
Time-resolved cathodoluminescence scanning electron microscope
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1002/pssa.202300114
Publication URI: http://dx.doi.org/10.1002/pssa.202300114
Type: Journal Article/Review
Parent Publication: physica status solidi (a)
Issue: 14