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Quantitative analysis of carbon impurity concentrations in GaN epilayers by cathodoluminescence (2023)

First Author: Loeto K

Attributed to: Integrated GaN-Diamond Microwave Electronics: From Materials, Transistors to MMICs funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.micron.2023.103489

PubMed Identifier: 37385074

Publication URI: http://europepmc.org/abstract/MED/37385074

Type: Journal Article/Review

Parent Publication: Micron

ISSN: 0968-4328