Quantitative analysis of carbon impurity concentrations in GaN epilayers by cathodoluminescence. (2023)
Attributed to:
Integrated GaN-Diamond Microwave Electronics: From Materials, Transistors to MMICs
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.micron.2023.103489
PubMed Identifier: 37385074
Publication URI: http://europepmc.org/abstract/MED/37385074
Type: Journal Article/Review
Volume: 172
Parent Publication: Micron (Oxford, England : 1993)
ISSN: 0968-4328