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Assessing the Quality of Oxygen Plasma Focused Ion Beam (O-PFIB) Etching on Polypropylene Surfaces Using Secondary Electron Hyperspectral Imaging. (2023)

First Author: Farr NTH

Attributed to: SEE MORE MAKE MORE: Secondary Electron Energy Measurement Optimisation for Reliable Manufacturing of Key Materials funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.3390/polym15153247

PubMed Identifier: 37571142

Publication URI: http://europepmc.org/abstract/MED/37571142

Type: Journal Article/Review

Volume: 15

Parent Publication: Polymers

Issue: 15

ISSN: 2073-4360