Assessing the Quality of Oxygen Plasma Focused Ion Beam (O-PFIB) Etching on Polypropylene Surfaces Using Secondary Electron Hyperspectral Imaging. (2023)
Attributed to:
SEE MORE MAKE MORE: Secondary Electron Energy Measurement Optimisation for Reliable Manufacturing of Key Materials
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.3390/polym15153247
PubMed Identifier: 37571142
Publication URI: http://europepmc.org/abstract/MED/37571142
Type: Journal Article/Review
Volume: 15
Parent Publication: Polymers
Issue: 15
ISSN: 2073-4360