Comparative investigation of anisotropic etches for polysilicon nanowire definition in thin film technology (2023)
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1088/2631-8695/acc310
Publication URI: http://dx.doi.org/10.1088/2631-8695/acc310
Type: Journal Article/Review
Parent Publication: Engineering Research Express
Issue: 1