Bias-voltage photoconductance and photoluminescence for the determination of silicon-dielectric interface properties in SiO2/Al2O3 stacks (2023)
Attributed to:
Charged oxide inversion layer (COIL) solar cells
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1063/5.0153204
Publication URI: http://dx.doi.org/10.1063/5.0153204
Type: Journal Article/Review
Parent Publication: Journal of Applied Physics
Issue: 7