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Bias-voltage photoconductance and photoluminescence for the determination of silicon-dielectric interface properties in SiO2/Al2O3 stacks (2023)

First Author: Masuch P

Attributed to: Charged oxide inversion layer (COIL) solar cells funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/5.0153204

Publication URI: http://dx.doi.org/10.1063/5.0153204

Type: Journal Article/Review

Parent Publication: Journal of Applied Physics

Issue: 7