Measurements and Review of Failure Mechanisms and Reliability Constraints of 4H-SiC Power MOSFETs Under Short Circuit Events (2023)

First Author: Yu R

Attributed to: Supergen Energy Networks hub 2018 funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/tdmr.2023.3316928

Publication URI: http://dx.doi.org/10.1109/tdmr.2023.3316928

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Device and Materials Reliability

Issue: 4