Comprehensive study of Raman optical response of typical substrates for thin-film growth under 633 nm and 785 nm laser excitation. (2023)
Attributed to:
ECCS - EPSRC Development of uniform, low power, high density resistive memory by vertical interface and defect design
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1364/oe.504002
PubMed Identifier: 37859160
Publication URI: http://europepmc.org/abstract/MED/37859160
Type: Journal Article/Review
Volume: 31
Parent Publication: Optics express
Issue: 21
ISSN: 1094-4087