Analysis of Schottky Contact Formation in Coplanar Au/ZnO/Al Nanogap Radio Frequency Diodes Processed from Solution at Low Temperature. (2016)
Attributed to:
EPSRC Centre for Innovative Manufacturing in Large Area Electronics
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1021/acsami.6b07099
PubMed Identifier: 27530144
Publication URI: http://europepmc.org/abstract/MED/27530144
Type: Journal Article/Review
Volume: 8
Parent Publication: ACS applied materials & interfaces
Issue: 35
ISSN: 1944-8244