A Pragmatic Model to Predict Future Device Aging (2023)
Attributed to:
Realistic fault modelling to enable optimization of low power IoT and Cognitive fault-tolerant computing systems
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/access.2023.3329077
Publication URI: http://dx.doi.org/10.1109/access.2023.3329077
Type: Journal Article/Review
Parent Publication: IEEE Access