Single Event Effects Assessment of UltraScale+ MPSoC Systems Under Atmospheric Radiation (2024)
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/tr.2023.3312548
Publication URI: http://dx.doi.org/10.1109/tr.2023.3312548
Type: Journal Article/Review
Parent Publication: IEEE Transactions on Reliability
Issue: 1