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Imaging Threading Dislocations and Surface Steps in Nitride Thin Films Using Electron Backscatter Diffraction (2023)

First Author: Hiller K

Attributed to: Manufacturing of nano-engineered III-nitride semiconductors funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1093/micmic/ozad118

Publication URI: http://dx.doi.org/10.1093/micmic/ozad118

Type: Journal Article/Review

Parent Publication: Microscopy and Microanalysis

Issue: 6