Electronic Band Offset Determination of Oxides Grown by Atomic Layer Deposition on Silicon (2023)
Attributed to:
EPRSC Resource Only Strategic Equipment: the Warwick Analytical Science Centre
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/jphotov.2023.3291048
Publication URI: http://dx.doi.org/10.1109/jphotov.2023.3291048
Type: Journal Article/Review
Parent Publication: IEEE Journal of Photovoltaics
Issue: 5
ISSN: 2156-3381