Sub-picosecond 1030 nm laser-induced damage threshold evaluation of pulsed-laser deposited sesquioxide thin films (2022)

First Author: Stehlik M

Attributed to: Laser Technologies for Future Manufacturing funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1117/1.oe.61.7.070903

Publication URI: http://dx.doi.org/10.1117/1.oe.61.7.070903

Type: Journal Article/Review

Parent Publication: Optical Engineering

Issue: 07

ISSN: 0091-3286