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Reliable extraction of x-ray refraction and dark-field signals with a large field of view, multi-modal scanning system at spectral energies up to 150 kVp (2024)

First Author: Partridge T

Attributed to: Nikon-UCL Prosperity Partnership on Next-Generation X-Ray Imaging funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/1361-6463/ad2096

Publication URI: http://dx.doi.org/10.1088/1361-6463/ad2096

Type: Journal Article/Review

Parent Publication: Journal of Physics D: Applied Physics

Issue: 17