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A high-throughput analysis of high-resolution X-ray CT images of stems of olive and citrus plants resistant and susceptible to Xylella fastidiosa (2023)

First Author: Walker N

Attributed to: Modelling the mechanisms of olive die back caused by Xylella fastidiosa biofilms funded by NERC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1111/ppa.13835

Publication URI: http://dx.doi.org/10.1111/ppa.13835

Type: Journal Article/Review

Parent Publication: Plant Pathology

Issue: 3