Enhanced quantification for 3D SEM-EDS: Using the full set of available X-ray lines (2015)
Attributed to:
An Advanced SEM-FIB Dual Beam Microscope for Three-Dimensional Mesoscale Fabrication, Imaging and Analysis
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.ultramic.2014.10.010
Publication URI: http://dx.doi.org/10.1016/j.ultramic.2014.10.010
Type: Journal Article/Review
Parent Publication: Ultramicroscopy