Enhanced quantification for 3D SEM-EDS: using the full set of available X-ray lines. (2015)
Attributed to:
An Advanced SEM-FIB Dual Beam Microscope for Three-Dimensional Mesoscale Fabrication, Imaging and Analysis
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.ultramic.2014.10.010
PubMed Identifier: 25461593
Publication URI: http://europepmc.org/abstract/MED/25461593
Type: Journal Article/Review
Volume: 148
Parent Publication: Ultramicroscopy
ISSN: 0304-3991