A new approach for combining yield and performance in behavioural models for analogue integrated circuits (2008)
Attributed to:
Electronics Design
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1145/1403375.1403414
Publication URI: http://dx.doi.org/10.1145/1403375.1403414
Type: Conference/Paper/Proceeding/Abstract