Impact of Turn-Off Gate Voltage and Temperature on Threshold Voltage Instability in Pulsed Gate Voltage Stresses of SiC MOSFETs (2023)
Attributed to:
Reliability, Condition Monitoring and Health Management Technologies for WBG Power Modules
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.4028/p-lidhbt
Publication URI: http://dx.doi.org/10.4028/p-lidhbt
Type: Journal Article/Review
Parent Publication: Materials Science Forum