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Impact of Turn-Off Gate Voltage and Temperature on Threshold Voltage Instability in Pulsed Gate Voltage Stresses of SiC MOSFETs (2023)

First Author: Deb A

Attributed to: Reliability, Condition Monitoring and Health Management Technologies for WBG Power Modules funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.4028/p-lidhbt

Publication URI: http://dx.doi.org/10.4028/p-lidhbt

Type: Journal Article/Review

Parent Publication: Materials Science Forum