In Situ Sputtering From the Micromanipulator to Enable Cryogenic Preparation of Specimens for Atom Probe Tomography by Focused-Ion Beam. (2023)
Attributed to:
Nanoscale Advanced Materials Engineering
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1093/micmic/ozad020
PubMed Identifier: 37749683
Publication URI: http://europepmc.org/abstract/MED/37749683
Type: Journal Article/Review
Volume: 29
Parent Publication: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
Issue: 3
ISSN: 1431-9276