Dynamic Measurements at up to 130-kHz Sampling Rates Using Ti:sapphire Dual-Comb Distance Metrology (2022)

First Author: Mitchell T

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1364/cleo_si.2022.ss1a.2

Publication URI: http://dx.doi.org/10.1364/cleo_si.2022.ss1a.2

Type: Conference/Paper/Proceeding/Abstract