Focused ion beam and field-emission microscopy of metallic filaments in memory devices based on thin films of an ambipolar organic compound consisting of oxadiazole, carbazole, and fluorene units (2013)
Abstract
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Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1063/1.4808026
Publication URI: http://dx.doi.org/10.1063/1.4808026
Type: Journal Article/Review
Parent Publication: Applied Physics Letters
Issue: 21