Focused ion beam and field-emission microscopy of metallic filaments in memory devices based on thin films of an ambipolar organic compound consisting of oxadiazole, carbazole, and fluorene units (2013)

First Author: Pearson C

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/1.4808026

Publication URI: http://dx.doi.org/10.1063/1.4808026

Type: Journal Article/Review

Parent Publication: Applied Physics Letters

Issue: 21