A method for crystallographic mapping of an alpha-beta titanium alloy with nanometre resolution using scanning precession electron diffraction and open-source software libraries (2024)
Attributed to:
Fast Pixel Detectors: a paradigm shift in STEM imaging
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1111/jmi.13275
Publication URI: http://dx.doi.org/10.1111/jmi.13275
Type: Journal Article/Review
Parent Publication: Journal of Microscopy