Octahedral Tilt Engineering: Atomic-Level Picture of Stabilized a-FAPbI3 (2022)
Attributed to:
Electron Diffraction Based Nano-Metrology
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.29363/nanoge.hpatom.2022.020
Publication URI: http://dx.doi.org/10.29363/nanoge.hpatom.2022.020
Type: Conference/Paper/Proceeding/Abstract