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Deep Learning Driven Data Processing, Modeling, and Inverse Design for Nanophotonics

First Author: Wiecha P

Attributed to: Non-contact scanning probe station for advanced wafer scale testing of photonic integrated circuits funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1002/9783527833030.ch7

Publication URI: https://api.elsevier.com/content/abstract/scopus_id/85169352022

Type: Book Chapter

Book Title: Integrated Nanophotonics - Platforms, Devices, and Applications (2023)

Page Reference: 245-275