A Stein Goodness-of-fit Test for Exponential Random Graph Models (2021)

First Author: Xu W.

Attributed to: CHARMNET - Characterising Models for Networks funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Publication URI: https://api.elsevier.com/content/abstract/scopus_id/85161822098

Type: Other

Volume: 130

Parent Publication: Proceedings of Machine Learning Research

ISSN: 26403498